Berthold France presents APM 3DLevelScanner product line in IPA 2010 - Paris, France
Open hours: 9:30-18:30
Venue: Parc des Expositions de Paris-Nord Villepinte
Location: Berthold Hall 7, Stand 34
IPA 2010 will bring together Managing Directors,
Production Managers, Company Managers, Purchasing Managers, R&D Managers from the food industry looking
for innovative and high-performance equipment and machinery in order to OPTIMIZE production facilities, INCREASE productivity and IMPROVE safety
APM wishes to invite you to visit Berthold stand to see the revolutionary 3DLevelScanner for bulk solid measurement.
No more inaccurate calculations based on a single sample point, but a unique family of devices that generate
3-dimensional maps of the content of the silo/open bin/warehouse.
APM’s innovative technology is the best-of-class solution for accurate measurement of bulk solids, particularly those in dusty environments
For the first time in the solids industry 3DLevel measurement provides true and accurate measures of volume and mass of silo contents – an achievement of critical importance for all solid industries.
3D Mapping of the surface area
You want to visit APM at the exhibition?
We are pleased to welcome you. You can directly make an appointment with our distributor.
A short e-mail is sufficient: email@example.com