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Sintrol presents 3DlevelScanner product line in Tekniikka 2010 - Jyväskylä, Finland

Dates: 5-7.10.2010   
Open hours
: 10:00-17:00   
Venue
: Jyv?skyl? Paviljonki
Location: Sintrol Stand D205

 

3DLevelScanner volume measurementMajor event for professionals provides the key for economical rise Professionals from all over Finland meet
at the 15th Tekniikka exhibition in Jyv?skyl? Paviljonki. 

The technology exhibition Tekniikka 2010 is the most important event of the year for automation, production technology and maintenance offering forsighted visions,
the best tools and the best doers of the industry.

APM wishes to invite you to visit Sintrol stand to see the revolutionary 3DLevelScanner for bulk solid measurement.

No more inaccurate calculations based on a single sample point, but a unique family of devices that generate
3-dimensional maps of the content of the silo/open bin/warehouse. 

APM’s innovative technology is the best-of-class solution for accurate measurement of bulk solids, particularly those in dusty environments

For the first time in the solids industry 3DLevel measurement provides true and accurate measures of volume and mass of silo contents – an achievement of critical importance for all solid industries.

  3D Mapping of the surface area

3D visualization

 

You want to visit APM at the exhibition?
We are pleased to welcome you. You can directly make an appointment with our distributor.
A short e-mail is sufficient: Tiina.Suumaki@sintrol.co

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